发明名称 WAVELENGTH DETECTOR
摘要 <p>A wavelength detector in which reference light (31) generated in a reference light source (30) and light (11) to be detected are directed to an etalon (62), and the light that has transmitted through the etalon is detected by light detecting means (64). The front focal surface (50) of a collimator lens (61) is irradiated with the reference light and the light to be detected. These lights are converted into parallel rays through the collimator lens and fall on the etalon. The reference light and the light to be detected that have passed through the etalon are focused by focusing lens means (63) on the detecting surface of light detecting means to form thereon interference fringes that correspond to the reference light and the light to be detected. Based on the interference fringes, relative wavelength of the light to be detected to the reference light, i.e., the absolute wavelength of the light to be detected, is measured.</p>
申请公布号 WO1990014582(P1) 申请公布日期 1990.11.29
申请号 JP1990000640 申请日期 1990.05.18
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址