| 摘要 |
A high resolution X-ray inspection system particularly adapted for electronic circuit components comprised of an X-ray cabinet including an X-ray tube which is located in a vertical tower and where the object and film are placed on a slidable support member located inside the lower portion of the cabinet, with the support member being slidable outwardly therefrom. The slidable support member includes provision for attaching, upon demand, a fluoroscopic imaging device whose output is optically coupled to a closed circuit TV camera located in the bottom of the housing beneath the slidable shelf. The fluoroscopic generator includes a thinly coated radioluminescent phosphor plate optically coupled to the input of an image intensifier comprised of a microchannel plate multiplier.
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