发明名称 SUPPORTING BLOCK OF WAFER OF EXPOSURE APPARATUS
摘要 PURPOSE:To enable execution of focusing in a short time irrespective of the thickness distribution of a wafer by bringing the wafer into close contact with the other main surface of glass of a projection-type exposure apparatus by using a shock absorbing material. CONSTITUTION:A wafer 13 for exposure is brought into close contact with the other main surface of glass 14 of a projection-type exposure apparatus by using a shock absorbing material 12. More particularly, the wafer 13 is brought into close contact with silica glass 14 by a spring 15 with a wafer chuck 12 interposed. Since the wafer chuck 12 is the shock absorbing material made of rubber, it operates to mitigate sufficiently a shock given to the wafer 13. Thus, a pattern can be transferred onto the wafer in a short time with excellent reproducibility, irrespective of nonuniformity in the thickness of the wafer.
申请公布号 JPH02281724(A) 申请公布日期 1990.11.19
申请号 JP19890103820 申请日期 1989.04.24
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YOSHIMURA RIE;OSHIMA MASAAKI
分类号 H01L21/30;G03F7/20;H01L21/027 主分类号 H01L21/30
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