发明名称 |
SUPPORTING BLOCK OF WAFER OF EXPOSURE APPARATUS |
摘要 |
PURPOSE:To enable execution of focusing in a short time irrespective of the thickness distribution of a wafer by bringing the wafer into close contact with the other main surface of glass of a projection-type exposure apparatus by using a shock absorbing material. CONSTITUTION:A wafer 13 for exposure is brought into close contact with the other main surface of glass 14 of a projection-type exposure apparatus by using a shock absorbing material 12. More particularly, the wafer 13 is brought into close contact with silica glass 14 by a spring 15 with a wafer chuck 12 interposed. Since the wafer chuck 12 is the shock absorbing material made of rubber, it operates to mitigate sufficiently a shock given to the wafer 13. Thus, a pattern can be transferred onto the wafer in a short time with excellent reproducibility, irrespective of nonuniformity in the thickness of the wafer. |
申请公布号 |
JPH02281724(A) |
申请公布日期 |
1990.11.19 |
申请号 |
JP19890103820 |
申请日期 |
1989.04.24 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
YOSHIMURA RIE;OSHIMA MASAAKI |
分类号 |
H01L21/30;G03F7/20;H01L21/027 |
主分类号 |
H01L21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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