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发明名称
SEMICONDUCTOR INSPECTION APPARATUS
摘要
申请公布号
JPH02281157(A)
申请公布日期
1990.11.16
申请号
JP19890102975
申请日期
1989.04.21
申请人
TOKYO ELECTRON LTD
发明人
AKIYAMA SHUJI
分类号
G01R31/26;G01R31/00;H01L21/66
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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