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发明名称
METHOD FOR INSPECTING PARTS OF CHIP ON CIRCUIT MOUNTED SUBSTRATE
摘要
申请公布号
JPH02280036(A)
申请公布日期
1990.11.16
申请号
JP19890102266
申请日期
1989.04.21
申请人
SEIKO EPSON CORP
发明人
FURUYA KAZUHIKO
分类号
G01N21/88;G01N21/956;H05K1/02;H05K3/34;H05K13/08
主分类号
G01N21/88
代理机构
代理人
主权项
地址
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