发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To reduce the interval between a collector and emitter electrodes for the decrease of parallel resistance therebetween, by partially removing a mask for thermal oxidation after etching with an Si3N4 mask on an Si substrate. CONSTITUTION:An N epitaxial layer 3 is formed on the P type Si substrate 1 having an N<+> type buried layer 2 to etch the N layer 3 by the laminated mask of thin SiO24 and Si3N45. Next, the SiO24 and Si3N45 are selectively opened hole to form thick SiO26, 7. Finally, an N collector 8, P base 9 and N emitter 10 are formed. Thus, a narrow wiring can be formed on a convex surface by providing an SiO27 in a convex form between the emitter and collector. Besides, the parallel resistance between the emitter and collector can be reduced by shortening the interval therebetween.
申请公布号 JPS57207350(A) 申请公布日期 1982.12.20
申请号 JP19810092491 申请日期 1981.06.16
申请人 NIPPON DENKI KK 发明人 KISHI TADASHI
分类号 H01L21/76;H01L21/316;H01L21/331;H01L21/762;H01L29/73 主分类号 H01L21/76
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