发明名称 REACTIVE ION ETCHING APPARATUS
摘要 An apparatus for etching the surface of a substrate or a thin film formed on the surface of the substrate by generating a plasma in an atmosphere of a reduced-pressure condition. The apparatus comprises an electrode having a protective coating, a susceptor for holding the substrate in the apparatus, means for supplying high-frequency electric power of a first frequency to the electrode, and means for supplying the susceptor with high-frequency electric power of a second frequency lower than the first frequency.
申请公布号 WO9013909(A1) 申请公布日期 1990.11.15
申请号 WO1990JP00585 申请日期 1990.05.08
申请人 OHMI, TADAHIRO 发明人 OHMI, TADAHIRO
分类号 C23C18/18;C23F4/00;H01J37/32;H01L21/302;H01L21/3065 主分类号 C23C18/18
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