发明名称 REACTIVE ION ETCHING APPARATUS
摘要 <p>An apparatus for etching the surface of a substrate or a thin film formed on the surface of the substrate by generating a plasma in an atmosphere of a reduced-pressure condition. The apparatus comprises an electrode having a protective coating, a susceptor for holding the substrate in the apparatus, means for supplying high-frequency electric power of a first frequency to the electrode, and means for supplying the susceptor with high-frequency electric power of a second frequency lower than the first frequency.</p>
申请公布号 WO1990013909(P1) 申请公布日期 1990.11.15
申请号 JP1990000585 申请日期 1990.05.08
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