| 摘要 |
PURPOSE:To facilitate the wiring of a burn-in board by providing a test circuit wherein an input/output terminal becomes an output state when voltage is applied to a test terminal. CONSTITUTION:When a low level is applied to a test terminal 104, a test circuit 106 is operated and an output stage transistor 103 becomes an output state and an input/output terminal 101 also becomes an output state. As a result, since the output level of the output stage transistor 103 is applied to the gate of an input stage transistor 102, no shortcircuit current flows between the source and drain of the input stage transistor 102. Since the input/output terminal 101 becomes an output state when a low level is applied to the test terminal 104 at the time of the wiring of a burn-in board, the burn-in board wherein no shortcircuit current flows to the input stage transistor 102 even when the input/output terminal 101 is opened can be realized. |
