Method and apparatus for sensing thermal stress in integrated circuits,申请号US19890440137-传众专利搜索

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发明名称	Method and apparatus for sensing thermal stress in integrated circuits
摘要
申请公布号	US4970497(A)	申请公布日期	1990.11.13
申请号	US19890440137	申请日期	1989.11.22
申请人	WESTINGHOUSE ELECTRIC CORP.	发明人	BROADWATER, STUART P.;HAVLIK, JOHN
分类号	H01L29/78;H01L27/02;H02H5/04	主分类号	H01L29/78
代理机构		代理人
主权项
地址

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