发明名称 Measurement of solid particle concentration in presence of a second particle type
摘要 This invention pertains to a method and an apparatus for determining concentration of solid particles of interest in a sample in the presence of at least one other type of solid particle by measuring light scatter at a wavelength which is independent of solid particle concentration which is not of interest and related to solid particle concentration of interest. Preferably, solid particles of interest are cells grown in cell culture medium comprising a solid substrate.
申请公布号 US4969741(A) 申请公布日期 1990.11.13
申请号 US19890383798 申请日期 1989.07.21
申请人 MASSACHUSETTS INSTITUTE OF TECHNOLOGY 发明人 KENNEDY, MAX J.;WANG, DANIEL I. C.;STEPHANOPOULOS, GREGORY N.
分类号 G01N21/51;G01N21/85 主分类号 G01N21/51
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