发明名称 |
Method for making a BiCMOS semiconductor device |
摘要 |
A method with less processing steps for making a BiCMOS semiconductor device which can be used both in high-integration, high-speed digital devices and in precise analog devices by forming within a single substrate a CMOS transistor, a metal contact emitter bipolymer transistor having the high load driving power and highly effective matching characteristics, and a polycrystalline silicon emitter bipolar transistor having a high-speed characteristic at a low current level. Said device includes a first and a second MOSFET, and a first and a second bipolar transistor on a first conductivity-type silicon substrate, wherein performing a second conductivity-type of ion-implantation for producing a first substrate region to thereon form the first MOSFET, and a third and a fourth substrate region to thereon form the first and second bipolar transistors, respectively on said substrate. The second MOSFET is subsequently formed in a second substrate region being located between the first and third substrate regions.
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申请公布号 |
US4970174(A) |
申请公布日期 |
1990.11.13 |
申请号 |
US19880244810 |
申请日期 |
1988.09.15 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
MIN, SUNG-KI;KAHNG, CHANG-WON;CHO, UK-RAE;YOUN, JONG-MIL;CHOI, SUKGI |
分类号 |
H01L29/73;H01L21/302;H01L21/331;H01L21/8249;H01L27/06;H01L27/10;H01L29/732 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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