发明名称 Method for making a BiCMOS semiconductor device
摘要 A method with less processing steps for making a BiCMOS semiconductor device which can be used both in high-integration, high-speed digital devices and in precise analog devices by forming within a single substrate a CMOS transistor, a metal contact emitter bipolymer transistor having the high load driving power and highly effective matching characteristics, and a polycrystalline silicon emitter bipolar transistor having a high-speed characteristic at a low current level. Said device includes a first and a second MOSFET, and a first and a second bipolar transistor on a first conductivity-type silicon substrate, wherein performing a second conductivity-type of ion-implantation for producing a first substrate region to thereon form the first MOSFET, and a third and a fourth substrate region to thereon form the first and second bipolar transistors, respectively on said substrate. The second MOSFET is subsequently formed in a second substrate region being located between the first and third substrate regions.
申请公布号 US4970174(A) 申请公布日期 1990.11.13
申请号 US19880244810 申请日期 1988.09.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 MIN, SUNG-KI;KAHNG, CHANG-WON;CHO, UK-RAE;YOUN, JONG-MIL;CHOI, SUKGI
分类号 H01L29/73;H01L21/302;H01L21/331;H01L21/8249;H01L27/06;H01L27/10;H01L29/732 主分类号 H01L29/73
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