发明名称 Temperature measuring device utilizing birefringence in photoelectric element
摘要 PCT No. PCT/JP88/00908 Sec. 371 Date May 11, 1989 Sec. 102(e) Date May 11, 1989 PCT Filed Sep. 9, 1988 PCT Pub. No. WO89/02586 PCT Pub. Date Mar. 23, 1989.A temperature measuring device intended to use the photoelastic effect of a transparent element. The present invention employs as the temperature sensing element a thermal expansion photoelastic cell comprising a photoelastic element and a stress generating element which are closely contacted with each other for yielding stress of anisotropy in the photoelastic element, which changes in response to changing ambient temperature, as the stress generating element is quite remarkably different in thermal expansion coefficient from the photoelastic element. An element is further provided to detect phase difference between two orthogonal light components passed through the photoelastic element which are one polarized component in a stress direction and the other component polarized in a direction perpendicular to the above stress direction when linearly polarized light is passed through the photoelastic element of the thermal expansion photoelastic cell. The detected phase difference is converted into a temperature, which is then displayed on a display device.
申请公布号 US4970385(A) 申请公布日期 1990.11.13
申请号 US19890360882 申请日期 1989.05.11
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TATSUNO, KYOICHI;WATANABE, IKUO
分类号 G01K11/12;G01K5/48;G01K5/52;G01L1/24 主分类号 G01K11/12
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