发明名称 Method of manufacturing a semiconductor device using SEG and a transitory substrate
摘要 A method of manufacturing a semiconductor device in which a silicon layer (8) is epitaxially grown on the surface of a doped monocrystalline semiconductor body (7), whereafter a connection is established between said semiconductor body (7) and a second semiconductor body (1) which is used as a supporting body, while at least one of the surfaces of the two bodies is firstly provided with an insulating layer (2,3) and a rigid connection is established between the bodies, whereafter the monocrystalline semiconductor body (7) is electrochemically etched away down to the epitaxially grown silicon layer (8), parts of the insulating layer (2,3) being removed prior to establishing the connection between the bodies (1,7), whereafter a layer of electrically conducting material (6) is deposited on the surface with a thickness which is larger than that of the insulating layer, whereafter a polishing treatment is performed at least down to the insulating layer.
申请公布号 US4970175(A) 申请公布日期 1990.11.13
申请号 US19890389650 申请日期 1989.08.04
申请人 U.S. PHILIPS CORPORATION 发明人 HAISMA, JAN;VAN DEN MEERAKKER, JOHANNES E. A. M.;VAN VEGCHEL, JOSEPHUS H. C.
分类号 H01L21/306;H01L21/20;H01L21/304;H01L21/3063;H01L21/3105;H01L23/14 主分类号 H01L21/306
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