发明名称 ALIGNER
摘要 PURPOSE:To prevent a patterning accuracy from being worsened by a contamination of a wafer stage on which a wafer is mounted by a method wherein a plurality of wafer stages are prepared, a stage cleaner used to clean the wafer stages is installed and the wafer stages are cleaned whenever an exposure operation is executed. CONSTITUTION:At least two wafer stages 7a, 7b used to hold a wafer 6 are arranged; they can be moved on a rail 10; in addition, a stage cleaner 5 is installed in a route of the circulation rail 10. While an exposure operation is being executed on one wafer stage 7, a remaining wafer stage 7 is cleaned in the wafer cleaner 5. Thereby, it is possible to completely remove fine exfoliated pieces of a photoresist which has adhered to the wafer stage 7.
申请公布号 JPH02271514(A) 申请公布日期 1990.11.06
申请号 JP19890092469 申请日期 1989.04.12
申请人 FUJITSU LTD 发明人 YAMAGUCHI SEIICHIRO
分类号 H01L21/30;G03F7/20;H01L21/027 主分类号 H01L21/30
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