| 摘要 |
In a method and device for measuring boards 10 which have at least one wane edge 10bb', 10bb'', the board is illuminated with a narrow linear beam 30' which runs essentially at right angles to the flat surfaces of the board. The point of incidence P of the beam on the board is moved across the whole width of the board, and the light diffusely reflected on the wane edge or the wane edges is intercepted in a detector 40a, 40b which is connected to an electronic evaluation unit and which is arranged under the support surface S of the board in such a way that, of the light diffusely reflected on each wane edge, only that part is intercepted which, in an oblique direction enclosing an acute angle β with respect to the support surface, continues under this plane and encloses, with the axis of the illuminating beam, an angle greater than 90 degree. <IMAGE> |
