发明名称 INSPECTION METHOD AND INSPECTION JIG FOR ELECTRIC CHARACTERISTICS OF CHIP TYPE ELECTRONIC PARTS
摘要 PURPOSE:To improve inspection speed and inspection precision by heating a chip type electronic parts at a specified temperature by utilizing transferring period to a characteristics inspection process. CONSTITUTION:Prior to introduction to the inspection process of electric characteristics, a chip type electronic parts is transferred from the inside of a transferring magazine 9 to the inside of an inspection jig 10A molded from metal or heat resistant plastic material. By operating a heating means 12 built in the bottom part of the main body of the inspection jig 10A, the chip type electronic parts 8 is heated at a specified temperature in the course of transferring to the inspection process of electric characteristics. Thereby inspection time is reduced, and capabilities of detecting leakage current is improved.
申请公布号 JPH02267928(A) 申请公布日期 1990.11.01
申请号 JP19890088793 申请日期 1989.04.07
申请人 NEC KANSAI LTD 发明人 ARAI SHINJI;NAKAMURA YONEICHIRO
分类号 H01G9/04;H01G13/00 主分类号 H01G9/04
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