发明名称 PHOTORESIST COMPOSITION FOR FAR ULTRAVIOLET LIGHT
摘要 PURPOSE:To obtain the photoresist adequate for an exposing with far UV light of <=313nm by using a compsn. contg. a copolymer having the repeating unit expressed by specific formula and a photosensitive agent. CONSTITUTION:The copolymer has the repeating unit expressed by the formula, where R1 denotes H or methyl group; R2 denotes an alkyl group, aralkyl group; R3 denotes H, alkyl group, alkenyl group, aralkyl group, aryl group; m denotes 1 to 6 integer; n1 to n5 denote mol% of respective units; n1=25 to 80; n2=10 to 70, n3=0 to 40; n4=0 to 40; n5=0 to 70. This copolymer is obtd. by bringing prescribed amine and/or alcohol into reaction with, for example, maleic anhydride and styrene. A naphthoquinone diazide compd. is used for the photosensitive agent and dioxane, etc., are used as a solvent. A surfactant, dye, stabilizer and sensitizer are adequately compounded at need with the photosensitive agent. This photoresist compsn. is irradiated with a KrF excimer laser of 248nm in particular. This compsn. allows alkaline development, has high transparency and dry etching resistance and is adequate for production of elements of a very high scale of integration.
申请公布号 JPH02267558(A) 申请公布日期 1990.11.01
申请号 JP19890088081 申请日期 1989.04.10
申请人 TOYO GOSEI KOGYO KK;NAGASE DENSHI KAGAKU KK 发明人 HAYASHI KEIICHI;KIKUCHI HIDEO;KOTANI TAKESHI;SANO MITSUHIKO
分类号 G03F7/039;C08F2/48;G03F7/033;H01L21/027;H01L21/30 主分类号 G03F7/039
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