发明名称 |
TESTING DEVICE FOR TESTING ELECTRICAL OR ELECTRONIC TEST SPECIMENS |
摘要 |
To test a test specimen, test signals produced by the test circuit system can be transmitted between the measuring points of the testing device and opposing test points of the test specimen. The testing device has at least one board comprising a semiconductor, on which at least several measuring points are provided and/or at least several contact pins for their electrical connection are arranged. |
申请公布号 |
WO9013039(A1) |
申请公布日期 |
1990.11.01 |
申请号 |
WO1990EP00668 |
申请日期 |
1990.04.25 |
申请人 |
ATG ELECTRONIC GMBH |
发明人 |
ARNAUDOV, KONSTANTIN;PROKOPP, MANFRED |
分类号 |
G01R1/073 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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