发明名称 INSPECTION OF FOREIGN MATTER
摘要 PURPOSE:To detect a foreign matter automatically and surely by making out a reference picture in which the foreign matter information is not included by a filtering process for approximately the same picture element size as that of the foreign matter and performing a picture subtracting process by the mentioned picture and an inspected picture. CONSTITUTION:The device is constituted of a conveyor 12 for ham 10, X-ray device 16, X-ray image intensifier camera 20, picture process device 22 consisting of an A/D converter 24, CPU 26 and frame memories 27, 28, and so on. The ham 10 is fixed within a field of view 17 of the X-ray to obtain the inspecting picture 10a by the X-ray transmission, and this picture is processed by the filter having the same picture size as that of the foreign matter to make out the reference picture 10c in which the foreign matter information is not included. Next, when the picture subtraction is made between the pictures 10a and 10c, a picture 10d for the foreign matter only is obtained if the picture 10a includes the foreign matter and a binarization process is made for this picture with a specified threshold to automatically detect the foreign matter. The automatic and sure detection for the foreign matter can be thereby performed.
申请公布号 JPH02266248(A) 申请公布日期 1990.10.31
申请号 JP19890088264 申请日期 1989.04.06
申请人 HITACHI PLANT ENG & CONSTR CO LTD 发明人 HAYATA FUMITAKA;FUKUZAWA KUNIYUKI;TOYODA NAOKI
分类号 G01N23/04 主分类号 G01N23/04
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