| 摘要 |
PURPOSE:To detect easily a catalyst having inferior activity by analyzing the noble metal catalyst deposited on a carrier of alumina, titanium dioxide, zirconia, etc. by a photoelectric spectrochemical method. CONSTITUTION:Light of X-rays, etc. is applied on a catalyst specimen formed by depositing noble metal such as ruthenium, platinum, rhodium, palladium, nickel or the like on a carrier of alumina, titanium dioxide, silica-alumina, zirconia, etc. and the energy distribution of the electron released from the specimen by a photoelectric effect is measured. Whether the activity of the catalyst is inferior or not is determined by identifying the presence of catalyst activity if the peak of the active metal in the X-ray photoelectron spectra is in the same position as the position of 0 valency or is shifted to an oxidation side and by rejecting the catalyst activity when said peak is shifted to a reduction side. The inferior activity occurring in the strong mutual effect of the catalyst-carrier is extremely easily detected according to such detecting method. |
