发明名称 DETECTION SYSTEM OF INK JET CHARGE DISTORTION
摘要 PURPOSE:To accomplish easy qualitative measurement of ink jet charge distortion through capturing of charged particles with more than one detection electrodes by having each particle flying through the same deflected electric field as they are charged with cyclic application of more than one charge voltages with different levels. CONSTITUTION:Particles are given a charge A2 with the application of a voltage V(A2) to a charge electrode 4 and deflected with a deflecting electrode 9 to be detected with a detection electrode 11. If the charge level thus detected is Q1(A2), accumulated charge level is as shown by the equation I after the procedure is repeated n times. Then, two voltage levels V(A1) and V(A2) are used as a charge signal to give charges A1 and A2 to one particle and the subsequent particle and the charged particles are detected with a detection electrode 12 and the detection electrode 11. If the charge levels thus detected are Q2(A1) and Q'1(A2), the charge level is as shown by the equations II and III after the procedure is repeated n times. The rate of charge distortion for the charged particle preceded by one particle is determined by the equation IV. Thus, the value of charge distortion can be measured qualitatively.
申请公布号 JPS5561480(A) 申请公布日期 1980.05.09
申请号 JP19780134313 申请日期 1978.10.31
申请人 RICOH KK 发明人 EBI YUTAKA
分类号 B41J2/12 主分类号 B41J2/12
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