发明名称 POSITIVE TYPE RESIST USING ELECTRON BEAMS
摘要 PURPOSE:To enhance sensitivity and resolution of a resist by incorporating a specified compound in a specified polymer. CONSTITUTION:This resist is formed by adding quaternary ammonium perchlorate (B) of formula II, each of R1 - R4 being 1 - 20 C alkyl, such as tetra-n-butyl ammonium perchlorate, to a cyclohexyl 2-cyanoacrylate polymer (A) of formula I having a molecular weight of 10<5> - 10<6>. This resist can be developed by a solvent mixture of 2-ethoxyethanol and 2-propanol and the like in a short time without leaving any residual film.
申请公布号 JPH02264955(A) 申请公布日期 1990.10.29
申请号 JP19890087703 申请日期 1989.04.06
申请人 TOPPAN PRINTING CO LTD 发明人 TAMURA AKIRA;SUGIURA TAKEO
分类号 G03F7/039;H01L21/027;H01L21/30;(IPC1-7):G03F7/039 主分类号 G03F7/039
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