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发明名称
DEFECT PHASE DETECTING METHOD AND CIRCUIT
摘要
申请公布号
JPS58139631(A)
申请公布日期
1983.08.19
申请号
JP19820021507
申请日期
1982.02.10
申请人
MITSUBISHI DENKI KK
发明人
KATOU HIROAKI;MASUDA NAOKI
分类号
H02H3/34
主分类号
H02H3/34
代理机构
代理人
主权项
地址
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