发明名称 MANUFACTURED OF SEMICONDUCTOR DEVICE
摘要 A step (10) in a semiconductor substrate (12) is buried by forming a first film (16) on a lower part and upper part of the step; adding a photoresist layer (20) with equal thickness to the step height on the first film at a portion corresponding to the lowr part of the step; adding a second film (38) on the photoresist layer and first film; adding a planar third film (24); etching away the third and second films; and removing the first film and photoresist layer. Pref. first film is oxide esp. SiO2, second film is a thin oxide layer esp. SiO2, and third film is a photoresist layer.
申请公布号 KR900007682(B1) 申请公布日期 1990.10.18
申请号 KR19870010355 申请日期 1987.09.18
申请人 MATSUSHITA ELECTRIC CO.,LTD. 发明人 FUSE KENSUI;NAKAO ICHIRO;DADEIWA GENJI;SIMODA HIDEAKI
分类号 H01L21/302;H01L21/027;H01L21/3065;H01L21/3105;H01L21/76;(IPC1-7):H01L21/30 主分类号 H01L21/302
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