发明名称 |
MANUFACTURED OF SEMICONDUCTOR DEVICE |
摘要 |
A step (10) in a semiconductor substrate (12) is buried by forming a first film (16) on a lower part and upper part of the step; adding a photoresist layer (20) with equal thickness to the step height on the first film at a portion corresponding to the lowr part of the step; adding a second film (38) on the photoresist layer and first film; adding a planar third film (24); etching away the third and second films; and removing the first film and photoresist layer. Pref. first film is oxide esp. SiO2, second film is a thin oxide layer esp. SiO2, and third film is a photoresist layer.
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申请公布号 |
KR900007682(B1) |
申请公布日期 |
1990.10.18 |
申请号 |
KR19870010355 |
申请日期 |
1987.09.18 |
申请人 |
MATSUSHITA ELECTRIC CO.,LTD. |
发明人 |
FUSE KENSUI;NAKAO ICHIRO;DADEIWA GENJI;SIMODA HIDEAKI |
分类号 |
H01L21/302;H01L21/027;H01L21/3065;H01L21/3105;H01L21/76;(IPC1-7):H01L21/30 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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