| 摘要 |
<p>PURPOSE:To improve the manufacturing yield of a display device by confirming visually and easily a pixel defect in the case of a failure of a thin film transistor, at the time of bringing the display device to full driving by applying a driving voltage to all pixel electrodes through the thin film transistor. CONSTITUTION:By applying a driving voltage to all pixel electrodes 5 through a thin film transistor TFT 6 from a gate bus 3 and a source bus wiring 4 of a liquid crystal display device, the display device is brought to full driving. In this case, in the case of a failure of the TFT 6, a pixel defect is confirmed visually and easily. In this pixel defect part, a joint metal 24 is irradiated with a laser light, etc., from the outside through the lower glass substrate 1 or the upper glass substrate 1. As a result, an extended end 16a, a base insulating film 11 and a joint metal layer 24 are melted mutually and a layer insulation layer is brought to dielectric breakdown and becomes a conducting state. In the same way, the conducting state is obtained between the electrode 5 side metallic piece 25 and the layer 24, as well. In such a way, a stand-by TFT 7 and the electrode 5 conduct. Also, a molten metal is not mixed into a liquid crystal since there is a protective film 17. In such a way, the pixel defect is corrected surely.</p> |
