| 摘要 |
The invention relates to an arrangement for injecting faults into electronic components. In order to check that fault-tolerant systems actually can tolerate internal faults, faults must be created in or injected into the components of the system under circumstances corresponding to normal operation. Fault injection trials are usually carried out only in a laboratory environment because trials in the field are rendered more difficult by the fact that a extensive apparatus has to be taken along. The invention solves this problem by producing a complete fault-injection arrangement by making it possible for the arrangement, together with the component into which faults are to be injected, to be positioned in the usual position of the component in the electronic system. The arrangement can consist of a miniature vacuum chamber containing a radiation source 1 and an irradiated component 2. The electrical connections 4 of the irradiated component have been extended through the bottom plate 5 of the vacuum chamber. <IMAGE> |
