发明名称 Method for producing semiconductor integrated circuit device
摘要 A method for producing a memory LSI having in its peripheral circuitry an MISFET of LDD structure and a vertical type bipolar transistor is disclosed. More particularly, an impurity for forming a low impurity concentration region of the said MISFET of LDD structure is introduced sideways of an emitter-base junction of the bipolar transistor. By the introduction of the said impurity, an effective impurity concentration near the base surface is reduced and the cut-off frequency of the bipolar transistor is improved.
申请公布号 US4962052(A) 申请公布日期 1990.10.09
申请号 US19900478050 申请日期 1990.02.07
申请人 HITACHI, LTD. 发明人 ASAYAMA, KYOICHIRO;MIYAZAWA, HIROYUKI;KOBAYASHI, YUTAKA;YUKUTAKE, SEIGOU
分类号 H01L21/331;H01L21/8249;H01L27/06;H01L27/10;H01L27/105;H01L29/10;H01L29/73;H01L29/732 主分类号 H01L21/331
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