发明名称 Semiconductor device
摘要 A MOS memory is formed in a semiconductor bulk, whereas a barrier semiconductor layer is disposed at the boundary between a MOS memory portion and the semiconductor bulk in order to reduce the effect of undesirable carriers excited by alpha -particles. The barrier semiconductor layer is designed to permit operation of the memory at low temperature while reducing the incidence of soft errors due to alpha -particles.
申请公布号 US4864382(A) 申请公布日期 1989.09.05
申请号 US19880148052 申请日期 1988.01.25
申请人 HITACHI, LTD. 发明人 AOKI, MASAAKI;YANO, KAZUO;MASUHARA, TOSHIAKI
分类号 H01L27/108;H01L29/10;H01L29/167;H01L29/66 主分类号 H01L27/108
代理机构 代理人
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