发明名称 THERMAL HEAD DEFECT DETECTIVE SYSTEM
摘要 A defect detection system of a thermal element comprises a power supply line (4) for supplying the power source (5) to the thermal element (1), a converting switch (7) for switching the printing power source and a power source to detect a defect, and a comparator (9) for detecting the defect of the thermal element by comparing the voltage drop generated by selecting the power source to detect a defect with the reference voltage.
申请公布号 KR900007294(B1) 申请公布日期 1990.10.08
申请号 KR19850000360 申请日期 1985.01.22
申请人 TOKYO ELECTRIC CO.,LTD. 发明人 ISHIKAWA MARNORU;SAKURA YASUHIRO;NIMURA HITOSHI;TAZIMA NORIYASU;TAKI YOSHIHIRO;SUZUKI MICHIO
分类号 G01R31/02;B41J2/35;B41J29/46;G01R27/08;H02H7/00;(IPC1-7):G01R27/08 主分类号 G01R31/02
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