发明名称 |
THERMAL HEAD DEFECT DETECTIVE SYSTEM |
摘要 |
A defect detection system of a thermal element comprises a power supply line (4) for supplying the power source (5) to the thermal element (1), a converting switch (7) for switching the printing power source and a power source to detect a defect, and a comparator (9) for detecting the defect of the thermal element by comparing the voltage drop generated by selecting the power source to detect a defect with the reference voltage.
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申请公布号 |
KR900007294(B1) |
申请公布日期 |
1990.10.08 |
申请号 |
KR19850000360 |
申请日期 |
1985.01.22 |
申请人 |
TOKYO ELECTRIC CO.,LTD. |
发明人 |
ISHIKAWA MARNORU;SAKURA YASUHIRO;NIMURA HITOSHI;TAZIMA NORIYASU;TAKI YOSHIHIRO;SUZUKI MICHIO |
分类号 |
G01R31/02;B41J2/35;B41J29/46;G01R27/08;H02H7/00;(IPC1-7):G01R27/08 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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