发明名称 AUTOMATIC TESTING CIRCUIT OF LAMP
摘要 <p>A circuit for automatically testing lamps in a digital watch at battery change comprises an AND gate connected between the one end of a NOR gate and the outputs of a function selecting switch (1) and a numeral changing switch (2), a SF flip-flop circuit connected to the other end of the NOR gate, and an inverter for inverting the output of the NOR gate.</p>
申请公布号 KR900007223(B1) 申请公布日期 1990.10.05
申请号 KR19870009188 申请日期 1987.08.21
申请人 SAM SUNG ELECTRONICS CO.,LTD. 发明人 LEE MYUNG-DON
分类号 G04G99/00;(IPC1-7):G04G1/00 主分类号 G04G99/00
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