Method and device for testing the time response of digital (switching) circuits

摘要

Method and device for testing the time response of digital circuits. The intention is to measure the delay time occurring between the application of stimulus data at the input and their appearance at the output of a sample, using simple means. Measurement is carried out in a plurality of test sequences which follow one another and contain a specific number of test steps, and the output data of the sample (1) are sampled using a programmed waiting time which increases incrementally with the test sequence. For the measurement, use is made of a computer (5) which contains the test program and determines the measurement run, with the aid of pin-electronics consisting of a waiting-time unit (4), an output unit (2) and an input unit (3). The method can be used for inspecting the dynamic response of digitial components.