发明名称 METHOD FOR INSPECTING SYSTEM BY LOGIC CELL ARRAY
摘要 PURPOSE:To execute a required inspection in a using field without providing an inspecting signal generator on the external by substituting inspecting program data obtained from an external ROM for internal program data in a logic array. CONSTITUTION:At the time of inspecting a system mounting a logic cell array(LCA), programming information for determining the internal constitution from the ROM 3 to the LCA 2 is substituted for inspecting programming information. When the inspecting programming information is applied, an 8-bit specific pattern generator 26, a 13-bit address counter 27, three-state buffers 23, 24, and a timing adjusting logic part 25 are constituted in the LCA 2. In addition, the LCA 2 is provided with specific terminals capable of individually inputting a counter enable signal CEL 1, a clear signal CLR 1 and a clock signal from a timing generator on the reproducing side. Thereby, a logic part 25 and buffers 23, 24 are used in common with a reproducing mode.
申请公布号 JPH02247739(A) 申请公布日期 1990.10.03
申请号 JP19890069847 申请日期 1989.03.20
申请人 SHARP CORP 发明人 YASUE HIDETAKA;YOSHIDA MASARU;SUGINO MICHIYUKI
分类号 G06F11/22 主分类号 G06F11/22
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