发明名称 TEST CIRCUIT USING PSEUDO MATRIX SWITCH
摘要 PURPOSE:To reduce the number of switches of relays and the like by mutually shorting respective scan lines in X and Y directions, which have been selected by means of operating the switch among a switch group. CONSTITUTION:For shorting a scan line X0 in the X direction and a scan line Y0 in the Y direction, for example, a pseudo matrix switch MG turns on respective switches 100 and 110, both of which are installed in accordance with respective scan lines. When the number (n) of the scan lines in the X direction in a matrix switch M is set to '4', the number (m) of the scan lines in the Y direction to '4', and the maximum number of ON-times to '1', only 4+4=8-number of switches (relays and the like) are needed in the pseudo matrix switch MG. Thus, the number of the switches can be reduced to half compared to a conventional circuit.
申请公布号 JPH02245832(A) 申请公布日期 1990.10.01
申请号 JP19890065912 申请日期 1989.03.20
申请人 FUJITSU LTD 发明人 SATO SHINICHI
分类号 G06F11/22 主分类号 G06F11/22
代理机构 代理人
主权项
地址