发明名称 SEMICONDUCTOR DEVICE
摘要 The pair of isolating grooves (9) extend through the silicon epitaxial layer (3), into a collector buried layer (2) and through to the substrate. In a bipolar large scale integration there are two thick oxide layers (12,15) and two silicon nitride layers (as 13) formed in an interdevice isolation area. In the course of manufacture, a silicon nitride film (13) is formed on the entire surface and a thick poly-silicon layer (14) is formed to fill the grooves. The poly-silicon film is then etched until the surface of the nitride film is exposed, to flatten the surface. A silicon dioxide film (15) is then formed with a thickness of about four hundred nanometres and the exposed nitride areas are removed.
申请公布号 KR900007149(B1) 申请公布日期 1990.09.29
申请号 KR19830004416 申请日期 1983.09.20
申请人 HITACHI LTD. 发明人 TAMAKI YOICHI;SIBA DAKEO;SAGARA KAZUHIKO;KAWAMURA MASAO
分类号 H01L21/302;H01L21/3065;H01L21/331;H01L21/76;H01L21/762;H01L21/763;H01L29/73;(IPC1-7):H01L21/76 主分类号 H01L21/302
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