| 摘要 |
PURPOSE:To improve the test efficiency of the data processor by decreasing exception generation ratio in a test instruction sequence which is generated by inputting random number data. CONSTITUTION:The data processor 1 is regarded as an object to be tested, a random number program 7 is loaded in a main storage device 6 from a test library in an external storage device 8, and the test instruction sequence is generated by this random number program 8. At this time, an exception is prevented from being generated and the data processor 1 is tested. Namely, when the test instructions are generated by inputting the random number data, exception factor information generated by the test instructions is obtained from an instruction parameter, its exception factor information is decided, and the operand data of the test instructions or arithmetic data are controlled to a value with which the exception is not generated or hardly generated. Consequently, the test efficiency of instructions which require a large amount of arithmetic data like vector arithmetic can be improved. |
