| 摘要 |
<p>A measuring probe (see Fig. 1) has a housing (16) having an axis (16A) and a movable structure (19) comprising a stylus holder (20) and stylus (22) mounted for tilting and axial movement with respect to the axis. A first fixed structure (40) is mounted within the housing and extends in the direction of the housing away from the stylus holder. A second fixed structure (36) is provided for connecting the first fixed structure to the housing. The movable structure (19) is supported in a positively defined rest position on a support plate (36A) of the second fixed structure by a kinematic support structure (30,34), and is biassed into the rest position by a spring (38). The second fixed structure (36) includes a relatively weak structure in the form of pillars (44) between the plate (36A) and the housing, and sensing means (46) are provided on the pillars 44. The spring force on the movable member is reacted against a transverse surface of the first fixed structure (40) whereby none of the spring forces are transmitted to the sensing means.</p> |
