| 摘要 |
<p>PURPOSE: To provide a lapping control system for a thin film magnetic transducer by taking out a control parameter correlation from the characteristics of a thin film magnetic transducer during the lapping operation. CONSTITUTION: A lapping depth generated by a lapping plate 26 is monitored through two test structures 14, 16. The test structures 14, 16 provide a means for electrically determining the throat height of a transducer element 12 as a function of the read current ISAT that saturates the magnetic head first, and the test structures are connected to a multiplexer 28. The multiplexer 28 senses ISAT and the electric resistance for the test structures 14, 16, imparting this information to a meter 30 and also transmitting it to a controller 32. The meter 30 measures resistance, current and inductance. The controller 32, controlling three actuators 20, 22, 24, enables the line of substrates to hold a fixed level by properly changing a pressure imparted by each actuator. Consequently, a desired lapping size can be obtained under the control of the test structures 14, 16.</p> |
