INTEGRIERTE HALBLEITERSCHALTUNGSEINRICHTUNG UND BETRIEBSVERFAHREN DAFUER

摘要

A substrate voltage generating circuit is provided on a semiconductor substrate, and the substrate voltage generating circuit generates a voltage to be applied to the semiconductor substrate. A value of the voltage generated by the substrate voltage generating circuit is changed corresponding to a switching of an operational mode of a semiconductor integrated circuit device from a normal mode to a test mode. Thus, operational characteristics of the semiconductor integrated circuit device in a test mode is changed, so that defective products can be detected in a simple short time test.