发明名称 TEST FOR CONNECTION OR SWITCHING OF APPARATUS OR LINE
摘要 PURPOSE: To test simply and accurately irrespective of a testing direction of a signal by a method in which continuous parallel first and second check words are respectively compared by a space division multiplex switching matrix and error display is performed when incogruous to each other. CONSTITUTION: In a switching cell S of [(n+m)×m]pieces of matrix arrangement, a space division multiplex switching matrix K is formed, and a built-in gate is controlled by input lines D1 to Dn and C1 to Cm so that a switch S is selected. Comparing with the switch S selecting a bit of continuous parallel first and second words from an output decorder 0D and an input decorder ED, an error signal 1 is output onto corresponding output lines Y1 to Ym via a clock circuit CL when incongruous to each other. With this structure, a switching effort is reduced irrespective of a progress direction of a signal without awaiting a reception completion of all bits, and it is possible to test simply, accurately and promptly.
申请公布号 JPH02238379(A) 申请公布日期 1990.09.20
申请号 JP19890336159 申请日期 1989.12.25
申请人 ALCATEL NV 发明人 HANSU YURUGEN MATSUTO;MAAKU GAASHIYU KAAPOBUSUKI;REBU BEROBITSUCHI REBITEIN
分类号 G01R31/00;H04Q1/24;H04Q11/04 主分类号 G01R31/00
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