发明名称 Trench memory cell
摘要 An improved memory cell layout (54) is formed including a trench cell (60) formed in a semiconductor substrate (58). The memory cell layout (54) includes a bitline (56) and a wordline (62) for storing and accessing charge. The charge is stored on a capacitor formed from a conductor (68), an insulating region (70) and a semiconductor substrate (58). Bitline (56) is primarily tangential to a trench cell (60), or may surround the periphery thereof. A wordline (62) overlies trench cell (60) and extends therein, and further may be formed of a width narrower than trench cell (60).
申请公布号 US4958212(A) 申请公布日期 1990.09.18
申请号 US19880292285 申请日期 1988.12.30
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 TENG, CLARENCE W.;RICHARDSON, WILLIAM F.;DOERING, ROBERT R.;SHAH, ASHWIN H.;SHEN, BING W.;BORDELON, MARK
分类号 H01L27/108 主分类号 H01L27/108
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