发明名称 Interferometer with thin absorbing beam equalizing pellicle
摘要 An interferometer includes a thin, absorbing pellicle in the path of a test beam to attenuate the test beam so that its intensity is approximately equal to the intensity of a reference beam. The pellicle reflects less than about six percent of the test beam, thereby avoiding spurious reflections that produce spurious fringes.
申请公布号 US4955719(A) 申请公布日期 1990.09.11
申请号 US19880282473 申请日期 1988.12.09
申请人 WYKO CORPORATION 发明人 HAYES, JOHN B.
分类号 G01B9/02;G01B11/24 主分类号 G01B9/02
代理机构 代理人
主权项
地址