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发明名称
ON-CHIP TEST SYSTEM FOR SEMICONDUCTOR MEMORY
摘要
申请公布号
JPH02226599(A)
申请公布日期
1990.09.10
申请号
JP19890044565
申请日期
1989.02.23
申请人
NEC CORP
发明人
TAKESHIMA TOSHIO
分类号
G11C29/00;G11C29/12
主分类号
G11C29/00
代理机构
代理人
主权项
地址
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