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发明名称
METHOD FOR TESTING INTEGRATED CIRCUIT DEVICE AND INTEGRATED CIRCUIT DEVICE
摘要
申请公布号
JPH02227681(A)
申请公布日期
1990.09.10
申请号
JP19890046965
申请日期
1989.02.28
申请人
TEXAS INSTR JAPAN LTD
发明人
SHINOZAKI KATSUMI;SAEKI SHOJI
分类号
G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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