发明名称 |
PARTICLE SIZE ANALYSIS UTILIZING POLARIZATION INTENSITY DIFFERENTIAL SCATTERING |
摘要 |
In a particle size measuring system, particles suspended in a sample cell (8') are illuminated by interrogating light beams (212) including a first interrogating component having a polarization parallel to a scattering plane, and a second interrogating component having a polarization perpendicular to the scattering plane. A photodetector (214) generates first and second intensity signals representative of the intensity, at various scattering angles, of scattered light corresponding to the first and second interrogating components. A processor (126) generates a difference signal representative of the difference between the first and second intensity signals, and calculates a resultant signal representative of particle size, based on a selected arithmetic transformation of the difference signal. |
申请公布号 |
WO9010215(A1) |
申请公布日期 |
1990.09.07 |
申请号 |
WO1990US01139 |
申请日期 |
1990.03.01 |
申请人 |
COULTER ELECTRONICS OF NEW ENGLAND, INC. |
发明人 |
BOTT, STEVEN, E.;HART, W., HOWARD |
分类号 |
G01N15/02;G01N15/14;G01N21/21;G01N21/49;G01N21/51 |
主分类号 |
G01N15/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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