发明名称 PARTICLE SIZE ANALYSIS UTILIZING POLARIZATION INTENSITY DIFFERENTIAL SCATTERING
摘要 In a particle size measuring system, particles suspended in a sample cell (8') are illuminated by interrogating light beams (212) including a first interrogating component having a polarization parallel to a scattering plane, and a second interrogating component having a polarization perpendicular to the scattering plane. A photodetector (214) generates first and second intensity signals representative of the intensity, at various scattering angles, of scattered light corresponding to the first and second interrogating components. A processor (126) generates a difference signal representative of the difference between the first and second intensity signals, and calculates a resultant signal representative of particle size, based on a selected arithmetic transformation of the difference signal.
申请公布号 WO9010215(A1) 申请公布日期 1990.09.07
申请号 WO1990US01139 申请日期 1990.03.01
申请人 COULTER ELECTRONICS OF NEW ENGLAND, INC. 发明人 BOTT, STEVEN, E.;HART, W., HOWARD
分类号 G01N15/02;G01N15/14;G01N21/21;G01N21/49;G01N21/51 主分类号 G01N15/02
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