发明名称 |
A METHOD FOR TESTING THE OPERATIONAL EFFICIENCY OF A COMPONENT OF AN ELECTRONIC CIRCUIT |
摘要 |
The present invention relates to a method for testing the operational efficiency of a component of an electronic circuit at low temperature, comprising the steps of chilling the component and/or its connections to the remainder of the circuit and measuring the operational functioning of the component and its connections in the circuit. The invention is characterised by the further step of applying carbon dioxide in a solid state to the component and/or the component connections, wherewith the carbon dioxide vaporises while chilling the component and/or said connections at the same time. |
申请公布号 |
WO9010240(A1) |
申请公布日期 |
1990.09.07 |
申请号 |
WO1990SE00071 |
申请日期 |
1990.02.05 |
申请人 |
AGA AB |
发明人 |
OEHRSTROEM, PER;NORLEN, STEN |
分类号 |
G01R31/02;G01R31/28;G01R31/30 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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