发明名称 APPARATUS FOR INSPECTING OPTICAL SIGNAL WAVELENGTH AND OPTICAL ELECTRIC POWER, METHOD FOR INSPECTING AND MATERIAL FOR RECORDING THE SAME
摘要 PURPOSE: An apparatus for inspecting an optical signal wavelength and an optical electric power, method for inspecting and a material for recording the same are provided to watch a mean optical electric power as measure the size of a modulated optical signal and an optical signal wavelength as measure the size and the phase of a modulated signal. CONSTITUTION: An apparatus for inspecting an optical signal wavelength and an optical electric power includes a first part(203) for receiving light, a band pass filter, a second part(207) for receiving light, an analog/digital transformation part(204, 208), and a part(205) for watching a wavelength and an optical electric power. The first part for receiving light is to receive an optical signal modulated by a pilot tone generation current and transform into an electric signal. The band pass filter is to receive an optical signal transformed by the pilot tone generation current and perform a band pass filtering. The second part for receiving light is to receive the filtered optical signal from the band pass filter and transform into an electrical signal, The analog/digital transformation part is to receive an analog signal from the first and second parts for receiving light, and transform into a digital signal. The part for watching a wavelength and an optical electric power is to receive the digital signal from the first and second parts for receiving light, perform a frequency transformation, and watch the wavelength and the optical electrical power.
申请公布号 KR20000025307(A) 申请公布日期 2000.05.06
申请号 KR19980042332 申请日期 1998.10.09
申请人 KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 JEONG, YOON CHEOL;PARK, GEUN JOO;SHIN, SEUNG GYOON
分类号 H04B17/00;H04J14/02;(IPC1-7):H04J14/02 主分类号 H04B17/00
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