发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To integrate a bipolar transistor and a MOS transistor monolithically without deteriorating characteristics of each element. SOLUTION: A 200 to 500 nm-thick isolation film 103 is formed by selective oxidation of a substrate 101 (LOCOS) to define a region for forming a bipolar transistor, a region (B) for forming an MOS transistor and a specified region on the substrate 101 formed of p-type silicon. A 5 to 50 nm-thick silicon oxide film 104, a 10 to 300 nm-thick silicon nitride film (anti-oxidation film) 105 and a 5 to 50 nm-thick silicon oxide film 106 are formed on the substrate 101. Thereafter, a photoresist pattern 107 with an opening 107a is formed by a known photolithography technique, and a silicon oxide film 106 in the part of the opening 107a is removed by using it as a mask.
申请公布号 JP2000183194(A) 申请公布日期 2000.06.30
申请号 JP19980356437 申请日期 1998.12.15
申请人 NEC CORP 发明人 NOCHIDA MASARU
分类号 H01L27/06;H01L21/762;H01L21/8222;H01L21/8248;H01L21/8249;(IPC1-7):H01L21/824;H01L21/822 主分类号 H01L27/06
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