发明名称 Method of chemical-mechanical polishing an electronic component substrate and polishing slurry therefor
摘要 Disclosed is a method of chem-mech polishing an electronic component substrate. The method includes the following steps; obtaining a substrate having at least two features thereon or therein which have a different etch rate with respect to a particular etchant; and contacting the substrate with a polishing pad while contacting the substrate with a slurry containing the etchant wherein the slurry includes abrasive particles, a transition metal chelated salt and a solvent for the salt. The chem-mech polishing causes the at least two features to be substantially coplanar. Also disclosed is the chem-mech polishing slurry.
申请公布号 US4954142(A) 申请公布日期 1990.09.04
申请号 US19890285435 申请日期 1989.03.07
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CARR, JEFFREY W.;DAVID, LAWRENCE D.;GUTHRIE, WILLIAM L.;KAUFMAN, FRANK B.;PATRICK, WILLIAM J.;RODBELL, KENNETH P.;PASCO, ROBERT W.;NENADIC, ANTON
分类号 B24B37/00;C09G1/02;H01L21/304;H01L21/306;H01L21/48 主分类号 B24B37/00
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