发明名称 SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a scanning probe microscope which can always keep vibration amplitude of a cantilever being fixed. SOLUTION: An output signal Asinωt of a phase control circuit 11 is input to an amplifier 13. A signal conversion circuit 14 converts the signal from the amplifier 13 into the specific amplitude signal Bsinωt. A RMS-DC circuit 16 detects the amplitude of the signal from the amplifiers 13 and outputs the detected amplitude as DC voltage Arms. The output Arms of the RMS-DC circuit 16 is inverted by an inversion amplifier 17 and an error amplifier 18 outputs a signal Verr=G(Vref-Arms). A multipliers 15 multiplies the output of the error amplifier 18 by the output of the signal conversion circuit 14 and outputs the signal Vout=BG(Vref-Arms)sinωt. The output signal Vout of the multiplier 15 is supplied through an attenuator 20 to a piezo element 7, and it is used as an excitation signal of the cantilever 5.
申请公布号 JP2002162334(A) 申请公布日期 2002.06.07
申请号 JP20000356021 申请日期 2000.11.22
申请人 JEOL LTD 发明人 TANAKA KATSUHIRO
分类号 G01B21/00;G01B21/30;G01Q60/24;G01Q60/32;G01Q60/38;(IPC1-7):G01N13/16;G12B21/08 主分类号 G01B21/00
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